Chris Kenney, Sherwood Parker and I met
for about an hour and a half in Chris' office in the Central Lab Annex,
sandwiched between other meetings.
Agenda:
- Application Detector Specs
- FP420
- TDA (Time Encoded Differential Absorption)
- Super KEKB
- Electronics Specs (for each of applications above)
- Number channels
- noise/speed trade-offs
- dynamic range/least count
- readout speed/rep rate/data volume
- Getting first test sensor (something in hand -- can be tiny)
- Current run plans
- Future run plans
Notes:
- Time pressure didn't allow too much discussion of items 1 and 2,
as much discussion was about issues with current run processing issues
with SINTEF.
- Sherwood now focussed on getting a faster readout chip and
sensors compatible to play with
- Much synergy here, though Chris is completely buried...
Action items:
- Agreement on Item 3 -- Sherwood is having the two test sensors,
the measurement of which he wrote the high-speed
paper on (Fig. 12-14), since he is now "done" with them. (so
we can test -- even in beam)
- Chris has agreed to try and fab a layout matching a previous
version of our specs, the layout drawing of which is posted here. (the layer mapping isn't
correct -- made in Cadence, viewed in Tanner)
- He has a number of sensors that we could probably use -- if they
can figure out how to remove a surface contaminant from the
wafers. He estimated an assay to resolve would cost 0.5-1k$, and
no guarantees. However, since the rest of the batch seemed OK,
apart from one mucked up (final) step, there is a good chance we will
have a large number of useable sensors -- if the contaminant can be
identified so the appropriate cleaner can be used. I told him we
would pay. Will follow-up in the new year.
- Sherwood is putting in a DOE ADR for
a next generation, fast timing pixel detector development. This
is along the lines for which I have applied for a DOE Early Career
(last year -- as I'll be Assoc Prof from summer -- or be given the
boot).
Last modified: 12/29/2009 --
GSV